NSN 5961013913735 (Semiconductor Devic) | NSN Parts Lookup

If you're in need of NSN 5961013913735 parts such as PRD3099, 1N6657LTXV, 171280-02, which have been manufactured by Solid State Devices Inc, Optek Technology Inc, Ge Aviation Systems Llc we can provide assistance. At ASAP Aero Supplies, we are a renowned distributor with an inventory of over 2 billion obsolete parts from more than 5,000 manufacturers around the world, which are ready for shipment. Our specialty lies in being the reputable distributor of NSN 5961013913735, also known as Semiconductor Devic parts.

We are dedicated to provide you with the premium quality NSN parts possible, including NSN 5961013913735. As the only independent distributor in the USA,  We pledge not source from China, you can be assured that we will go above and beyond to fulfill your needs.

Information for NSN 5961013913735, 5961-01-391-3735

Part Number's List for NSN 5961013913735, 5961-01-391-3735

Part No Manufacturer Item Name QTY RFQ
PRD3099 solid state devices inc semiconductor devic Avl RFQ
PRD3099 optek technology inc semiconductor devic Avl RFQ
PRD3099 ge aviation systems llc semiconductor devic Avl RFQ
1N6657LTXV ge aviation systems llc semiconductor devic Avl RFQ
1N6657LTXV optek technology inc semiconductor devic Avl RFQ
1N6657LTXV solid state devices inc semiconductor devic Avl RFQ
171280-02 solid state devices inc semiconductor devic Avl RFQ
171280-02 optek technology inc semiconductor devic Avl RFQ
171280-02 ge aviation systems llc semiconductor devic Avl RFQ

5961-01-391-3735 Characteristics Data

MRCCriteriaCharacteristic
TTQYTERMINAL TYPE AND QUANTITY3 PIN
CTQNVOLTAGE RATING IN VOLTS PER CHARACTERISTIC100.0 MAXIMUM REVERSE VOLTAGE, INSTANTANEOUS ALL SEMICONDUCTOR DEVICE DIODE AND 100.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE
CTQXCURRENT RATING PER CHARACTERISTIC40.00 AMPERES FORWARD CURRENT, AVERAGE ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE AND 400.00 AMPERES FORWARD CURRENT, AVERAGE PRESET ALL SEMICONDUCTOR DEVICE DIODE
PMLCPRECIOUS MATERIAL AND LOCATIONTERMINAL AREAS IAW MIL-STD-2000 PARA. 5.4.17.2 GOLD
TESTTEST DATA DOCUMENT35351-171280 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)
ABBHINCLOSURE MATERIALCERAMIC
ABKWOVERALL HEIGHT0.560 INCHES MAXIMUM
AKPVMOUNTING FACILITY QUANTITY4
ALAZJOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATIONTO-254AA
ASKACOMPONENT NAME AND QUANTITY2 SEMICONDUCTOR DEVICE DIODE
CTMZSEMICONDUCTOR MATERIALSILICON ALL SEMICONDUCTOR
CTSGMAXIMUM OPERATING TEMP PER MEASUREMENT POINT175.0 DEG CELSIUS JUNCTION
ABHPOVERALL LENGTH0.990 INCHES MAXIMUM
ASCKRESPONSE TIME35.0 NANOSECONDS MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE
PRMTPRECIOUS MATERIALGOLD
AXGYMOUNTING METHODTERMINAL AND UNTHREADED HOLE
ABMKOVERALL WIDTH0.545 INCHES MAXIMUM

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